Parallel Test for up to 8 Devices, and a Highly Clean Test Environment
Image sensors are used in an increasingly broad range of product applications, such as cellular phones and digital home appliances. At the same time, unit prices of logic devices, system LSIs and other devices continue to decline, contributing to development of a growing array of high-resolution microscopic devices. Against this background, an increasing proportion of a device's total cost is represented by cost of test, which creates strong incentives to reduce this cost. ADVANTEST delivers an effective response to these needs in the form of the M4551A Test Handler. Incorporating our proven handler technology, the M4551A is the newest and most advanced logic device handler, optimal for testing image sensors.
High Throughput and Stable Operation Reduce Cost of Test
The M4551A parallel-tests up to eight devices at room temperature and above. Its wide measurement bed enables it to adapt to device sizes or light source layouts more flexibly than conventional testers. Leveraging a device-handling mechanism with an established reputation for success, the M4551A optimizes motion control, attaining high throughput and stable operation simultaneously.
A Highly Clean Test Environment for Image Sensors
Minimization of microscopic dust allows for clean test of high-density image sensors at an accelerated pace; an optional configuration allows the M4551A to achieve a Class-100 clean environment (optional). This strict environmental control yields device test characterized by improved reliability and throughput.
Free Selection of Light Source through the Dead-Bug Method
The M4551A supports various types and sizes of light sources, made possible through its use of the dead-bug method. This method positions the light source, required for image sensor testing, underneath the device. Also, the ease with which the light source can be dismounted facilitates improved maintenance of the light source itself, as well as the handler.
| Target Packages | DIP, SOP, LCC, etc. |
|---|---|
| Simultaneous Testing | Up to 8 devices |
| Throughput | 2,200 devices per hour |
| Temperature Range | Room temperature, +50 to +125°C |
