Industry Trends & Events in test and measurement . . .

Building on the success of its standard HR30 connector, Hirose offers a version that allows for a custom overmold to be applied to the connector. Hirose supplies connectors that are overmold ready, giving design engineers the opportunity to design the overmold to suit their application.

The NoiseKen ESS-2000AX ESD Simulator generates highly consistent, repeatable ESD pulses up to 30 kV in both contact and air discharge modes. Compliant with IEC61000-4-2 standard, the unit features a 5.7 in. display, a lightweight gun and optic serial interface. Read more…

The Martel BetaProbe TI digital thermometer eliminates the "cons" of L-I-G thermometers, while providing ±0.06 degree accuracy over a wide measurement range, integral multi-angle probe, high resolution user settings, optional data logging, large easily read backlit display, configurable trend indicator, CSA/ATEX approval for hazardous areas, and NIST-traceable calibration.

Beamex introduces a smarter, more efficient and accurate solution for calibrating temperature. It is a complete solution for temperature calibration with various different products and services, such as a series of high-quality dry blocks for field and laboratory use, smart reference probes and temperature calibration laboratory services.

Ensuring the safety and reliability of aircraft both during manufacture and after assembly often involves load cells, which behave in a predictable way when subjected to a force. This white paper from Honeywell explains the theory of load cells and their application in testing materials for strength and resilience, testing the aircraft frame structure and integrity, and providing in-flight testing and monitoring during normal operation.

Every measurement includes some error. Knowing how much error can help determine the success of your measurement step. Instrument specifications generally present the error as percent of reading or percent of full scale. This article from Test & Measurement World describes the types of error, examines how to decide how much error you can tolerate, and explores ways to calibrate your instruments to minimize it.

LabView has become the software environment of choice for most test-program development. It offers test engineers graphical representations of target objects to eliminate the need to write low-level code to execute the tests. This tutorial from National Instruments describes the software and how it has evolved since its introduction. The author also offers some useful suggestions on how best to take advantage of its features and capabilities.

Ensuring proper operation of a fiber-optic network used to require the service of 10 different test instruments. Now, JDSU has combined those functions into a single instrument, limiting the number of instruments that technicians must carry into the field and dramatically reducing costs while storing a coherent record of all measurements in a single folder.

Laboratory instruments from METTLER TOLEDO build the safe and solid basis of testing and quality in laboratories all over the world. They improve processes for routine analysis, method development, quality control and research.

Visit our Web site to get more detailed information regarding METTLER TOLEDO products and services.

Campbell Scientific data acquisition systems provide long- or short-term measurement and control in harsh, remote environments. Systems are compatible with almost any sensor and support multiple remote communication options, such as cell phone, radio, satellite, and TCP/IP. Protocol support includes Modbus and DNP3.

The Fischer product line is comprised of a broad spectrum of high-quality measuring and analysis instruments for many diverse applications and industries. Whether you need handheld or bench top, Eddy current or magnetic induction, beta-backscatter, coulometric or x-ray fluorescence, or need to measure ferrite content or conductivity, Fischer has the solution.

Anritsu, the most trusted name in the business, provides the industry's broadest portfolio of easy-to-use, full-featured, handheld test and measurement analyzers. As a globally-recognized innovator, our products are on the leading edge of speed, reliability, and accuracy. See Anritsu's video on the Master family of handheld analyzers and solutions.

The continuing price pressure on electronics manufacturers has encouraged an entire industry of device counterfeiters. Companies have instituted elaborate inspection techniques to ensure that the devices they buy are actually the ones they are paying for. Yet according to this discussion from EE Times, such measures do not eliminate the problem. The only way to know that you are getting the genuine article is to know your supplier.

As long as graphene remained largely a laboratory curiosity, efficient inspection methods for ensuring its integrity were unnecessary. Its emergence into the mainstream, however, represents a considerable challenge. For example, graphene's performance changes dramatically depending on the number of graphene layers in an application. This piece from Nanowerk describes the problems along with inspection techniques that are emerging to cope with them.

As demand increases for the next-generation LTE networks, chipset and mobile-device manufacturers need base-station simulators to ensure that their products will satisfy customers. To meet that need, Anritsu has developed a powerful LTE protocol-test solution. Among its capabilities, the signaling tester offers RF/baseband protocol sequence tests, performance tests, acceptance tests, and field-problem troubleshooting tests.

So you have an LTE wideband-communications tester. How do you use it most effectively? This step-by-step demo from Rohde & Schwarz walks you through the functions and operations of their CMW500, exploring its features in detail, as well as how to apply them to the communications testing task and how the display presents the results.

The affordable Agilent 2000/3000 X-Series scopes offer more performance and capabilities than any other oscilloscope in this class, with:

• The largest screen in its class, the deepest memory, fastest waveform update rates.
• Up to 4 instruments in 1: oscilloscope, function generator, logic/protocol analyzer.
• The industry's only fully upgradable oscilloscope.

The Smart DS Series-SDS6062 was developed by Xiamen Lilliput Technology Co,.Ltd. Specifications include a 60 MHz bandwidth, 4.8 in. color LCD screen, waveform storage, and has an autoscale function. To learn more about the product visit their site.

Model 2210 MEMS capacitive accelerometer modules feature high-drive, low-impedance buffering for precision acceleration measurements in commercial and industrial environments. With available ranges from ±2 to ±400 g and a standard 1 in. square footprint, the 2210 is ideal for use in zero-to-medium frequency instrumentation applications, including vibration analysis, machinery control, modal analysis, robotics, and crash testing.

This high-quality Clamp Meter measures both AC/DC current and voltage, and is TRMS permitting precise measurements regardless of waveforms. The ST-3347 can measure AC/DC voltage up to 600 volts, resistance up to 40 MΩ, capacitance up to 40 mF, frequency up to 4 kHz, and temperature up to 1000 C (1832 F).