The industry's most efficient analog test system for power ICs
The demand for highly efficient power supplies is increasing as mobile devices and electronic devices such as OA peripheral equipment become smaller and lighter in weight. The new, T7910, is an analog test system specifically designed for testing power supply ICs. It offers greater functionality and performance than the earlier model T7912, and is capable of testing power ICs with fewer pins with higher efficiency. An optimum channel configuration can be selected to match the number of pins and devices for performing parallel tests, resulting in higher performance and an overall reduction in test costs
Optomized channel configuration
The optimal channel configuration can be selected with 2 to 16 channels for device power supply and 6 to 48 channels for I/O power supply, to match the number of pins and devices for performing parallel tests.
System software
- Functions can be extended using COM∗, dedicated software interface.
- Fast test data collection in the log. Customizable log output format.
- Device program generation tool is available. (Option Software)
Major Specifications
| Target Devices | Low-pin-count power ICs |
|---|---|
| Parallel Testing | Max. 8 devices |
Basic Configuration
| Device Power Supply | 2 channels to max. 16 channels ±64V/±300mA to 8µA ±32V/±500mA to 8µA, ±32V/±1A (pulse) ±16V/±500mA to 8µA, ±16V/±3A (pulse) |
|---|---|
| Power Supply for I/O | 6 channels to max. 48 channels ±64V/±32mA to 8µA, ±16V/±64mA to 8µA |
Option
| High Voltage Power Supply | 1 channel to 8 channels (MPX switch) +2kV/+1mA (per 1 channel) |
|---|---|
| Time Measurement Unit | 8ch (A/B×4ch) Measurement Range 10ns to 65s Resolution 100ps |
