Description
20 Measurement Parameters: Measure and display any two of 15 impedance parameters simultaneously, with a basic accuracy of 0.1%. Additionally the 1920 can measure the DC resistance, or display the current through or voltage across a test device ensuring the operator of the real test conditions.
Wide Frequency: Over 27,000 user programmable test frequencies to fully characterize devices over the range of 20 Hz to 1 MHz.
Automatic Test Sequencing: For increased productivity and throughput the 1920 can perform up to six different tests in sequence with a single push of the start button. Each test can have different measurement parameters, test conditions and limits.
DC Bias Voltage: The instruments internal DC bias voltage source, programmable from 0 to 2 V in 1 mV steps, allows capacitors to be tested under real DC bias conditions.
Setup Storage/Recall: The test operator has the ability to store and recall, from internal memory, up to 30 single test setups and 10 sequential setups (six tests in sequence). The front panel can be locked out, with password protection, to ensure that procedures are run the same way every time.
Load Correction: Substantially improves instrument accuracy by allowing the operator to specify the value of a known standard, measure it, and apply a correction to ongoing measurements.
Programmable Source Impedance: The operator is able to set instrument source impedance at 5, 25, 50 or 100 ohms, an important feature when comparing measurements to those made on other testers. Measurement results can vary substantially based solely on the source impedance of the tester being used.
Features
- Measures 15 Impedance Parameters, DC Resistance, Voltage and Current
- 0.1% Basic Measurement Accuracy
- 27,000 Programmable Frequencies from 20Hz to 1MHz
- AC Test Voltage Programmable from 20mV to 1V
- Internal DC Bias Voltage, Programmable from 0 to 2V
- Fast Measurement Speeds up to 40/Second
- Automatic Open/Short Zeroing Eliminates Connection Errors
- LCD Display for Menu Programming and Test Results
- 14 Hi/Lo Sorting Bins for Pass/Fail Testing
- RS232, IEEE-488 and PLC Interfaces all Standard
- Results Displayed as Deviation or %Deviation from a Nominal Value
- Internal Storage and Recall of 30 Test Setups
- Monitor Voltage and Current to the Device Under Test
- Constant Voltage Maintained to the Device Under Test
- Ability to Automatically Perform 6 Unique Tests in Sequence
- Keypad Lockout Prevents Changes to the Test Setup
- Programmable Average and Delay Times
- Automatic Correction for Different Test Lead Lengths
